X-ray Diffraction (XRD) is a non-destructive analytical technique used to determine phase composition, crystallographic structure, and lattice parameters of crystalline materials.
Based on diffraction patterns generated when monochromatic X-rays interact with a crystalline sample.
Sample is irradiated with monochromatic X-rays to study internal crystal structure.
Constructive interference occurs at specific angles, forming a unique diffraction pattern.
Used to identify phases, crystal structures, and lattice parameters accurately.
XRD is widely used in materials science, pharmaceuticals, and geology for quality control, research & development, and advanced material characterization.
(888) 4000-2424